An Improved Markov Random Field Design Approach For Digital Circuits Jahanzeb Anwer, Nor Hisham Bin Hamid and Vijanth Sagayan Asirvadam

As the MOSFET dimensions scale down to nanoscale level, the reliability of circuits based on these devices decreases. Therefore, a mechanism has to be devised that can make the nanoscale systems perform reliably using unreliable circuit components. The solution is fault-tolerant circuit design. Markov Random Field (MRF) is an effective approach that achieves fault-tolerance in integrated circuit design. The previous research on this technique suffers from limitations at the design, simulation and implementation levels. As improvements, the MRF fault-tolerance rules have been validated for a practical circuit example. The simulation framework is extended from thermal to a combination of thermal and random telegraph signal noise sources to provide a more rigorous noise environment for the simulation of nanoscale circuits. Moreover, an architecture-level improvement has been proposed in the design of previous MRF gates. The re-designed MRF is termed as Improved-MRF. By... Это и многое другое вы найдете в книге An Improved Markov Random Field Design Approach For Digital Circuits (Jahanzeb Anwer,Nor Hisham Bin Hamid and Vijanth Sagayan Asirvadam)